Evolution of Microcracks in Epitaxial CeO2 Thin Films on YSZ-Buffered Si

Soo Young Jung; Hyung‐Jin Choi; Jun Young Lee; Minseok Kim; Ruiguang Ning; Dong-Hun Han; Seong Keun Kim; Sung Ok Won; June Hyuk Lee; Ji‐Soo Jang; Ho Won Jang; Seung‐Hyub Baek

doi:10.1007/s13391-023-00449-w

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