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Erratum: X-ray grazing incidence diffraction from alkylsiloxane monolayers on silicon wafers [J. Chem. Phys. <b>95</b>, 2854 (1991)] — I. M. Tidswell (1993) | RDL Network
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Erratum: X-ray grazing incidence diffraction from alkylsiloxane monolayers on silicon wafers [J. Chem. Phys. <b>95</b>, 2854 (1991)]
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George M M Whitesides
Harvard University
Erratum: X-ray grazing incidence diffraction from alkylsiloxane monolayers on silicon wafers [J. Chem. Phys. <b>95</b>, 2854 (1991)]
Corrigendum
1993
en
Authors
+3 more
IT
I. M. Tidswell
TR
T. A. Rabedeau
PP
P. S. Pershan
Abstract
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