Enhanced electric resistivity and dielectric energy storage by vacancy defect complex

Hao Pan; Nan Feng; Xing Xu; Weiwei Li; Qinghua Zhang; Shun Lan; Yiqian Liu; Haozhi Sha; Ke Bi; Ben Xu; Jing Ma; Lin Gu; Rong Yu; Yang Shen; Xiao Renshaw Wang; Judith L. MacManus‐Driscoll; Chong-lin Chen; Ce‐Wen Nan; Yuanhua Lin

doi:10.1016/j.ensm.2021.08.027

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