Electrothermal Dynamics of Semiconductor Nanowires under Local Carrier Modulation

Charge transfer, surface/interface, defect states, and internal fields strongly influence carrier statics and dynamics in semiconductor nanowires. These effects are usually probed using spatially resolved scanning current techniques, where charge carriers are driven to move by diffusion force due to a density gradient, drift force due to internal fields, and thermoelectric force due to a temperature gradient. However, in the analysis of experimental data, analytical formulas are usually used which are based on the assumption that a single component of these forces dominates the carrier dynamics. In this work we show that this simplification is generally not justified even in the simplest configurations, and the scanning microscopy data need to be analyzed with caution. We performed a comprehensive numerical modeling of the electrothermal dynamics of free charge carriers in the scanning photocurrent microscopy configuration. The simulation allows us to reveal and predict important, surprising effects that are previously not recognized, and assess the limitation as well as potential of these scanning current techniques in nanowire characterization.