Electron transport in bilayer graphene nanoconstrictions patterned using atomic force microscope nanolithography — Robert W. Rienstra (2025) | RDL Network
Electron transport in bilayer graphene nanoconstrictions patterned using atomic force microscope nanolithography
Article 2025 en
Authors
RR
Robert W. Rienstra
NS
Nishat Sultana
ES
En-Min Shih
Abstract
1 min read
Here we report on low temperature transport measurements of encapsulated bilayer graphene nano constrictions fabricated employing <i>electrode-free</i> AFM-based local anodic oxidation (LAO) nanolithography. This technique allows for the creation of constrictions as narrow as 20 nm much smaller than previous studies. In wider constrictions, we observe bulk transport characteristics. However, as the constriction's width is reduced, a transport gap appears. Single quantum dot (QD) formation is observed within the narrowest constriction with addition energies exceeding 100 meV, which surpass previous experiments on patterned QDs. Our results suggest that transport through these narrow constrictions is governed by edge disorder combined with quantum confinement effects. Our findings introduce <i>electrode-free</i> AFM-LAO lithography as an easy and flexible method for creating nanostructures with tunable electronic properties without relying on patterning techniques such as e-beam lithography.
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