Electron diffraction determination of the molecular structure of tetrasilylhydrazine

The structure of tetrasilylhydrazine, (SiH3)4N2, has been determined by the sector microphotometer method of electron diffraction. The data are consistent with planar Si2NN groups, and a dihedral angle of 82·5 ± 0·8°; the deviation of this angle from 90° may possibly be explained by torsional effects. The Si–H, N–Si, and N–N bond lengths are 1·487 ± 0·014, 1·731 ± 0·004, and 1·457 ± 0·016 Å respectively; the Si–N–Si angle is 129·5 ± 0·7° and the N–Si–H angle is 109·0 ± 1·4°.