Effects of line defects on the electronic and optical properties of strain-engineered WO3 thin films

Jingting Yang; Chao Ma; Chen Ge; Qinghua Zhang; Jianyu Du; Jiankun Li; Heyi Huang; Meng He; Can Wang; Sheng Meng; Lin Gu; Huibin Lü; Guozhen Yang; Kuijuan Jin

doi:10.1039/c7tc03896h

Abstract

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We report the discovery of a new line defect, and the modification of electronic structures in strain engineered WO3 films.

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