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Edge effects in thin film delamination — Honghui Yu (2001) | RDL Network

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Edge effects in thin film delamination

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John W. Hutchinson

Harvard University

Edge effects in thin film delamination

Article 2001 en

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Authors

HY
Honghui Yu
MH
Ming He
John W. Hutchinson
Harvard University

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Publication Info

DOI: 10.1016/s1359-6454(00)00293-7
Year: 2001
Published: —
Language: en

Article Details

Volume: 49
Issue: 1
Link Of The Paper: https://doi.org/10.1016/s1359-6454(00)00293-7

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Created:June 19, 2026

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