Dual-gradient structure leads to optimized combination of high fracture resistance and strength-ductility synergy with minimized final catastrophic failure — Ruqing Cao (2021) | RDL Network
Dual-gradient structure leads to optimized combination of high fracture resistance and strength-ductility synergy with minimized final catastrophic failure
Journal of Materials Research and Technology 15: 901-910
Article 2021 English
Authors
RC
Ruqing Cao
QY
Qin Yu
YL
Y. Li
Abstract
1 min read
Nature-inspired gradients can be implemented in metallic materials to achieve a synergy of strength and ductility. However, due to the small (often microscale) size of the gradient structured samples, their fracture properties have remained relatively unexplored. By fabricating centimeter-sized gradient-structured pure nickel samples using direct-current electroplating technique, we demonstrate that a dual-gradient architecture in pure nickel, comprising grain-size transitions from coarse grains to nano grains and then back to coarse grains (CG→NG→CG), achieves an optimized combination of strength-ductility synergy and exceptional fracture resistance – a crack-initiation toughness exceeding 300 MPa m½ – while minimizing the problem of final unstable catastrophic failure. Significantly, this dual-gradient CG→NG→CG structure can effectively arrest any brittle fracture in the nano grains by inducing a stable rising R-curve with an enhanced crack-growth toughness exceeding 350 MPa m½. We believe that this dual-gradient CG→NG→CG structure provides a promising prototype for designing multi-layer graded structures with exceptional combinations of mechanical properties which can be readily tuned to meet the advanced requirements of safety-critical applications.
Dong Liu, Qin Yu, Saurabh Kabra, Ming Jiang, Paul Forna-Kreutzer, Ruopeng Zhang, Madelyn I. Payne, Flynn Walsh, Bernd Gludovatz, Mark Asta, Andrew M. Minor, E.P. George, Robert O. Ritchie
Dong Liu, Qin Yu, Saurabh Kabra, Ming Jiang, Paul Forna-Kreutzer, Ruopeng Zhang, Madelyn I. Payne, Flynn Walsh, Bernd Gludovatz, Mark Asta, Andrew M. Minor, E.P. George, Robert O. Ritchie
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