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Determination of nitrogen-related defects in N-implanted ZnO films by dynamic cathodoluminescence — Yongfeng Mei (2005) | RDL Network
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Determination of nitrogen-related defects in N-implanted ZnO films by dynamic cathodoluminescence
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Paul Kim Ho Chu
Determination of nitrogen-related defects in N-implanted ZnO films by dynamic cathodoluminescence
Article
2005
en
Authors
+4 more
YM
Yongfeng Mei
GS
G. G. Siu
RF
Ricky K.Y. Fu
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