Determination of Critical Carrier Density in Re-doped WSe&lt;sub&gt;2&lt;/sub&gt; Crystal and Their Application to Esaki Diode

Takahide Sugiyama; Shigekazu Morito; Tomonori Nishimura; Kaito Kanahashi; Keiji Ueno; Kenji Watanabe; Takashi Taniguchi; Kosuke Nagashio

doi:10.7567/ssdm.2025.k-2-04

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