Design of ellipsometry parametric stable measurement system based on double-elastic light

Guo Haojie; Rui Zhang; Xue Peng; XU Cheng-yu; Lyu Jianning; Zhibin Wang

doi:10.5768/jao202546.0203002

Related publications

Article2013

Bandgap Measurement by Spectroscopic Ellipsometry for Strained Ge1-xSnx

Yosuke Shimura, Wei Wang, Thomas Nieddu, Federica Gencarelli, Benjamin Vincent, Priya Laha, Herman Terryn, Stefan Stefanov, S. Chiussi, Joris Van Campenhout, Ngoc Duy Nguyen, A. Vantomme, Roger Loo

Article2013

A Design of Intelligent Video Surveillance System Based on 3G Network

Qigui Zhang, Rui Zhang

International Journal of Digital Content Technology and its Applications

Article2009

Seeing and counting graphene layers by elastic light scattering

Cinzia Casiraghi, Achim Hartschuh, Elefterios Lidorikis, Hu‐Jun Qian, Hayk Harutyunyan, Tobias Gokus, Konstantin ‘kostya’ Novoselov, A. C. Ferrari

Bulletin of the American Physical Society

Article2023

Non-parametric severity-duration-frequency analysis of drought based on satellite-based product and model fusion techniques

Seyedeh Mahboobeh Jafari, Mohammad Reza Nikoo, Mojtaba Sadegh, Mingjie Chen, Amir Gandomi

Environmental Science and Pollution Research

Article2016

Surface topography measurement of double-curved propeller blades using projected fringes

Kjell G. Robbersmyr, Kjell J. Gåsvik, Trond Vadseth, Hamid Reza Karimi

The International Journal of Advanced Manufacturing Technology