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Design of a mechanism for sample approach and alignment of a metrological atomic force microscope — Jan Piot (2011) | RDL Network
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Design of a mechanism for sample approach and alignment of a metrological atomic force microscope
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Jean-pierre Kruth
KU Leuven
Design of a mechanism for sample approach and alignment of a metrological atomic force microscope
Article
2011
English
Authors
+5 more
JP
Jan Piot
JQ
Jun Qian
HP
Hugo Pirée
Abstract
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