CT Metrology for Engineering and Manufacture

Frank Welkenhuyzen, Ye Tan, Kim Kiekens, W. A. Frank, Tan Ye, Philip Bleys, André Voet, Wim Dewulf, Kruth Jean-Pierre, Philip Bleys, Wim Dewulf, Jean-pierre Kruth, André Voet, Kim Kiekens

Article2011

A test object with parallel grooves for calibration and accuracy assessment of industrial CT metrology

Kim Kiekens, Frank Welkenhuyzen, Ye Tan, Philip Bleys, André Voet, Jean-pierre Kruth, Wim Dewulf

Article2014

Investigation of the Kinematic System of a 450 kV CT Scanner and its Influence on Dimensional CT Metrology Applications

Frank Welkenhuyzen, Bart Boeckmans, Ye Tan, Kim Kiekens, Wim Dewulf, Jean-pierre Kruth