The authors use low-temperature Raman spectroscopy measurements on gate-tunable graphene encapsulated in hBN to explore in detail the Raman $G$ and 2D mode frequencies and linewidths as function of the charge carrier density. This study provides a reference for Raman spectroscopy on ultraflat high-quality graphene (with a minimum 2D Raman line width of 14.5 cm${}^{\ensuremath{-}1})$ and is useful to investigate electron-phonon coupling and to benchmark graphene samples (including graphene-based heterostructures) when using Raman spectroscopy for process monitoring.
Hitesh Agarwal, Antoine Reserbat‐Plantey, David Barcons Ruiz, Karuppasamy Soundarapandian, Geng Li, Vahagn Mkhitaryan, Johann Osmond, Helena Lozano, Kenji Watanabe, Takashi Taniguchi, Petr Stepanov, Frank H. L. Koppens, Roshan Krishna Kumar
Rupini Kamat, Aaron L. Sharpe, Mihir Pendharkar, Jenny Hu, Steven J. Tran, Gregory Zaborski, M. B. Hocking, Joe Finney, Kenji Watanabe, Takashi Taniguchi, M. A. Kastner, Andrew J. Mannix, Tony F. Heinz, David Goldhaber‐Gordon
Rupini Kamat, Aaron L. Sharpe, Mihir Pendharkar, Jenny Hu, Steven J. Tran, Gregory Zaborski, M. B. Hocking, Joe Finney, Kenji Watanabe, Takashi Taniguchi, M. A. Kastner, Andrew J. Mannix, Tony F. Heinz, David Goldhaber‐Gordon
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