Characterization of Silicon Nitride/Lanthanide-Oxide Interfaces at the Atomic Scale by Scanning Transmission Electron Microscopy and Density Functional Theory — Juan Carlos Idrobo (2005) | RDL Network
Characterization of Silicon Nitride/Lanthanide-Oxide Interfaces at the Atomic Scale by Scanning Transmission Electron Microscopy and Density Functional Theory
Christian Dwyer, Alexander Ziegler, N. Shibata, Graham B. Winkelman, R. L. Satet, Michael J. Hoffmann, Michael K. Cinibulk, P. F. Becher, G. S. Painter, Nigel D. Browning, D. J. H. Cockayne, Robert O. Ritchie, Stephen J. Pennycook
Sarah J. Haigh, Aidan P. Rooney, Tom J.A. Slater, Éric Prestat, Ekaterina Khestanova, Rob Dryfe, Matěj Velický, Р. В. Горбачев, Rada Boya, Yang Cao, I. V. Grigorieva, Konstantin ‘kostya’ Novoselov, Freddie Withers, A. K. Geǐm
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