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Beam hardening correction and its influence on the measurement accuracy and repeatability for CT dimensional metrology applications — Ye Tan (2012) | RDL Network
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Beam hardening correction and its influence on the measurement accuracy and repeatability for CT dimensional metrology applications
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Jean-pierre Kruth
KU Leuven
Beam hardening correction and its influence on the measurement accuracy and repeatability for CT dimensional metrology applications
Article
2012
en
Authors
+2 more
YT
Ye Tan
KK
Kim Kiekens
FW
Frank Welkenhuyzen
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Related publications
Article
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Beam hardening correction and its influence on the measurement accuracy and repeatability for CT dimensional metrology applications
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