Backside Absorbing Layer Microscopy: Monolayer Counting in 2D Crystal Flakes

In article number 2300068, Dominique Ausserré, Fabien Vialla and co-workers combine Backside Absorbing Layer Microscopy (BALM) and an original self-calibrating image analysis procedure to achieve simple, accurate monolayer counting in exfoliated 2D material stacks. The authors demonstrate characterization of flakes from 1 to >30 monolayer thickness with the challenging case of transparent hexagonal boron nitride (hBN).