Automated High-Resolution Phase-Contrast Scanning Transmission Electron Microscopy
Article 2024 en
Authors
AP
Alexander J. Pattison
CP
Cássio Cardoso Santos Pedroso
BC
Bruce E. Cohen
Abstract
1 min read
Here, in this presentation, we demonstrate the operation and applications of a custom-built automation program to acquire high-resolution data on an aberration-corrected STEM.
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