In this paper, we present a technique to enhance transition delay and stuck-open fault testing in an LSSD environment. To reduce shift dependency in the scan path, thereby improving transition quality, a re-arrangement heuristic combined with a one level XOR network is proposed. The method is hierarchical, combining a simple re-arrangement, heuristic driven local reconfiguration, and finally a circuit modification to improve delay fault testing.
Zheng-Da Li, Ya-Li Mao, Mirjam Weilenmann, Armin Tavakoli, Hu Chen, Lixin Feng, Sheng-Jun Yang, Marc-Olivier Renou, David Trillo, Lê Phuc Thinh, Nicolas Gisin, Antonio Acín, Miguel Navascués, Zizhu Wang, Jingyun Fan
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