Atomic resolution transmission electron microscopy of the intergranular structure of a Y{sub 2}O{sub 3}-silicon nitride ceramic — Alexander Ziegler (2002) | RDL Network
Atomic resolution transmission electron microscopy of the intergranular structure of a Y{sub 2}O{sub 3}-silicon nitride ceramic
OSTI OAI (U.S. Department of Energy Office of Scientific and Technical Information)
Article 2002 English
Authors
AZ
Alexander Ziegler
CK
Christian Kisielowski
MH
Michael J. Hoffmann
Abstract
1 min read
High-resolution transmission electron microscopy (HRTEM) employing focus-variation phase-reconstruction methods is used to image the atomic structure of grain boundaries in a silicon nitride ceramic at a resolution of 0.8 Angstrom
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