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Atomic force microscopy study of growth kinetics: Scaling in TiN–TiB2 nanocomposite films on Si(100) — Paul Kim Ho Chu (2005) | RDL Network
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Atomic force microscopy study of growth kinetics: Scaling in TiN–TiB2 nanocomposite films on Si(100)
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Paul Kim Ho Chu
Atomic force microscopy study of growth kinetics: Scaling in TiN–TiB2 nanocomposite films on Si(100)
Article
2005
en
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Paul Kim Ho Chu
ZL
Z.-J. Liu
YL
Yang Lü
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