Analysis of depth profiles of sol-gel derived multilayer coatings by Rutherford backscattering spectrometry and by cross-sectional transmission electron microscopy1

C. Schutte; Patrick M. Smith; George M M Whitesides

doi:10.1557/jmr.1991.0835

Analysis of depth profiles of sol-gel derived multilayer coatings by Rutherford backscattering spectrometry and by cross-sectional transmission electron microscopy1 — C. Schutte (1991) | RDL Network

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Analysis of depth profiles of sol-gel derived multilayer coatings by Rutherford backscattering spectrometry and by cross-sectional transmission electron microscopy1

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George M M Whitesides

Harvard University

Analysis of depth profiles of sol-gel derived multilayer coatings by Rutherford backscattering spectrometry and by cross-sectional transmission electron microscopy1

Article 1991 en

Authors

CS
C. Schutte
PS
Patrick M. Smith
George M M Whitesides
Harvard University

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Publication Info

DOI: 10.1557/jmr.1991.0835
Year: 1991
Published: —
Language: en

Article Details

Volume: 6
Issue: 4
Link Of The Paper: https://doi.org/10.1557/jmr.1991.0835

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