This study is focused on the deposition process of zirconium-based conversion layers on Zn surfaces. The analysis approach is based on a Kretschmann configuration in which in situ ATR-FTIR spectroscopy is combined with open circuit potential (OCP) and near surface pH measurements. Differently pretreated Zn surfaces were subjected to conversion treatments, while the Zr-based deposition mechanism was probed in situ. It was found that the initial hydroxyl fraction promotes the overall Zr conversion process as the near surface pH values are influenced by the initial hydroxyl fraction. Kinetics of the early surface activation and the subsequent Zr-based conversion process are discussed and correlated to the initial hydroxyl fractions.
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