Optimization of the device structure of organic light-emitting diodes (OLEDs) is required for improved reliability and performance. An apparatus is described that enables a matrix of OLEDs to be fabricated in a single experiment, i.e., under comparable conditions, on a single substrate by combinatorial techniques. It is demonstrated that the influence of layer thickness variation of one or more layers on the device performance can be easily studied—as illustrated on the cover of this issue. The technique is also suitable for the fast screening and optimization of materials.
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