This paper focuses on the effect of aluminium surface pretreatment on the formation of thin non‐functional silane films. Three pretreatments were used to prepare the aluminium surface before the deposition of silane films. The generated surfaces were characterized before and after the silane film deposition by infrared spectroscopic ellipsometry (IRSE) and by the combination of SEM, AES and spectroscopic ellipsometry (SE), respectively. It is demonstrated that the amounts of hydroxyl groups at the aluminium surface provided by the different pretreatments strongly influence the initiation and the formation of the silane films. Copyright © 2004 John Wiley & Sons, Ltd.
The effects of a.c.-electrochemical graining and anodizing of an aluminium substrate on the layer properties of both barrier and porous alumina layers are
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A method to quantify the composition of anodic oxide films on aluminum using Infrared Spectroscopic Ellipsometry (IRSE) is proposed. It consists of obtaining the absorption coefficient of the film as a function of wavelength. Using values of the absorption coefficients for the pure components of the film, the percentages (mole or wt%) of each component in the sample can be calculated.The method is demonstrated in a study of the structure of the oxide film on electropolished aluminum and the anodically formed barrier layer film. Both surface oxides were found to be initially a form of amorphous Al2O3. While the barrier film is essentially free of water as prepared, the film on electropolished aluminum contained about 25 wt% water. Hydration of both types of films by immersion in boiling water results in the formation of pseudoboehmite (AlOOH). The technique may have more general applicability to the quantitative determination of the composition of corrosion films and other surface layers on metals.
No abstract is provided for this article.
SummaryThe composition of chromium free conversion layers on aluminium, based on zirconium has been determined using complementary surface analytical techniques: SEM, AES, XPS, SIMS. The zirconium based chromium free conversion layer consists of a two layered structure, with total thickness less than 10 nm, in which the bottom layer contains only Al and O, while the top layer contains also a fluorinated zirconium compound and probably a polymer that is concentrated towards the outer surface. In a second part the influence of the conversion time on the thickness of the film was studied using AES, SE and EIS. It is concluded that the zirconium based conversion layers are formed within ten seconds and a successive increase in conversion time results only in a very slight thickening of the layer.
No abstract is provided for this article.
Factor analysis was applied to Auger sputter profiles of tungsten carbide and nitride samples. It is shown that very weak differences in the shapes of the metal peaks due to the presence of C and N can be isolated unambiguously by factor analysis. The different chemical states of carbon, nitrogen and tungsten were clearly identified.