999 publications from this institution
In recent years, several groups have investigated the use of Proximal Spatial Light modulation (PSML) as an alternative fiber optic imaging technique. In PSLM, the light exiting the distal end of the fiber optic endoscope can be focused, without any distal micro-optics or micro-mechanics, on any point within the Field Of View (FOV) via spatial modulation of the light before it is coupled in at the endoscope's proximal end. In previous work, we reported on the custom design of a Coherent Fiber Bundle made with soft glasses (as opposed to the commercially available optical fibers used by other groups) to be used with PSLM. In this paper we present the results of the numerical characterization of the Coherent Fiber Bundle fabricated according to our design. We investigate the CFB's modal propagation characteristics as well as its imaging properties (FOV and point spread function). Our numerical characterization also takes into account fabrication induced defects such as variations in core size, core shape (ellipticity) and lattice constant. Realistic values for the defects were obtained via SEM images of the fabricated CFB's cross section. We find that noise on the wave front of the field exiting the distal end of the CFB causes a much larger deterioration of the point spread function than amplitude noise. And while we find that variations in core shape have the largest impact on the CFB's propagation characteristics, our results indicate that this negative impact could be negated if the elliptical cores were aligned along a common axis.
Chromium phosphate conversion coatings were characterised by spectroscopic ellipsometry. A two-layer optical model was used for the simulation and regression analysis procedures. The optical constants of the upper layer of the model are described by a dispersion relation. The second layer of the optical model is an interface layer, located between the aluminium substrate and the top layer. The optical model used both the Forouhi–Bloomer and the Sellmeier dispersion relations. In both cases, the optical constants of the top layer seem to correspond to those of chromium phosphate, provided the coatings are sufficiently thick. When thinner coatings are considered, the presence of other compounds or voids modify the optical constants. Nevertheless, an accurate coating thickness was determined for all conversion times.
A comparative electrochemical study of commercially recycled AA5050 and model AA5050, in their as‐cast state, is carried out to investigate the effect of recycling and furthermore the effect of trace elements like Pb, Cu, etc on electrochemical activation and filiform corrosion (FFC) susceptibility. A systematic combination of surface analytical techniques like scanning Kelvin probe force microscopy (SKPFM), scanning electron microscopy (SEM) and energy dispersive X‐ray (EDX) is used to study the composition and electrochemical behaviour of second phase particles. These results, together with localized breakdown measurements using the electrochemical micro‐cell, elucidate the effect of recycling and the role played by trace elements in influencing the electrochemical behaviour of the alloy.
No abstract is provided for this article.
A model trivalent chromium-based electroplating bath doped with different concentrations of Fe was used to obtain different metallic coatings. The impact of the Fe was investigated on both the Cr layer and its native passive film by a detailed characterisation using X-ray Photoelectron Spectroscopy (XPS), Angle Resolved XPS and Auger Electron Spectroscopy. Moreover, the semiconducting properties of their oxide layers were explored by Mott-Schottky and the corrosion performance of the coating by linear polarisation resistance and kinetics of the oxide formation. Results revealed not only a homogeneous Fe distribution in the Cr layer but also the presence of an iron-chromium duplex oxide layer for concentrations ≥ 100 mg l −1 Fe in the bath. The Mott-Schottky analysis showed a p-n junction for such coatings due to the presence of an iron oxide layer on top of a chromium oxide one, which increased the total amount of point defects (charge carrier density) and drastically affected to their corrosion resistance (the polarisation resistance decreased by one order of magnitude and their oxide layer showed slower kinetics and a higher passivation current). In contrast, coatings with a single chromium oxide layer showed a p-type semiconducting behaviour as well as the best corrosion performance.
