950 publications from this institution
Significance Assembling 2D materials into vertically stacked heterostructures allows an unprecedented control over their properties. The interaction between the individual crystals plays the crucial role here; thus, the information about the local atomic stacking is of great importance. Still, there are no techniques which would allow investigation of the stacking between such crystals with any reasonable throughput. We present the use of convergent beam electron diffraction (CBED) to investigate the quality of the interface in such heterostructures. We demonstrate that defects such as misorientation, strain, ripples, and others can be visualized, and quantitative information about such structures can be easily extracted. Furthermore, CBED images can be treated as holograms; thus their reconstruction gives 3D profiles of the heterostructures over a large area.
In this paper we report the first integration of a silicon microfabricated gas chromatography column with an ion trap mass spectrometer. The MEMS-column is fabricated in all silicon materials, with an integrated platinum resistive heater and temperature sensors. This design enables low power operation and rapid temperature heating, which are both useful for temperature programmed separations. The ion trap mass spectrometer has miniaturized electronics, including a compact RF generator, miniature detector system and control electronics which form the walls of the vacuum chamber. The integrated system has been demonstrated to separate a model mixture containing chemicals from different functional groups in under 22 min, while only consuming less than 15 W of power (30 W with vacuum pump).