950 publications from this institution
Josephson junctions (JJ) are essential for superconducting quantum technologies and searches of self-conjugate quasiparticles, pivotal for fault-tolerant quantum computing. Measuring the current-phase relation (CPR) in JJ based on topological insulators (TI) can provide critical insights into unconventional phenomena in these systems, such as the presence of Majorana bound states (MBS) and the nature of non-reciprocal transport. However, reconstructing CPR as a function of magnetic field in such JJs has remained experimentally challenging. Here, we introduce a platform for precise CPR measurements in planar JJs composed of NbSe$_2$ and few layer thick Bi$_2$Se$_3$ (TI) as a function of magnetic field. When a single flux quantum $\Phi_\mathrm{0}$ threads the junction, we observe anomalous peak-dip-shaped CPR behaviour and non-reciprocal supercurrent flow. We demonstrate that these anomalies stem from the edge-amplified sloped supercurrent profile rather than MBS signatures often invoked to explain puzzles emerging near $\Phi_\mathrm{0}$ in TI-based JJ. Furthermore, we show that such a supercurrent profile gives rise to a previously overlooked, robust and tunable Josephson diode effect. These findings establish field-dependent CPR measurements as a critical tool for exploring topological superconducting devices and offer new design principles for non-reciprocal superconducting electronics.
Convergent-beam electron diffraction (CBED), recently demonstrated on two-dimensional (2D) materials, offers a number of interesting applications such as imaging atomic in- and out-of plane shifts, interlayer distances, and individual adsorbates. In this study, we show how CBED allows for atomic-precision imaging of individual defects in 2D materials using one single-shot intensity measurement. In combination with structural calculations using density-functional theory, we present simulated CBED patterns for various defects in graphene, each of which exhibits a unique fingerprint distribution. We also show how atomic positions, including the individual atomic defects in graphene, can be reconstructed by iterative phase retrieval from a single CBED pattern.