Reflection electron microscopy (REM) is applied to image the structure of polished natural diamond (001) surfaces (of 5 x 4 mm size) after friction experiments under a pressure below the critical value. Friction tracks marked by a diamond needle after a single pass movement under a pressure of 13 GPa can be seen in REM images and show non-uniform contrast. The surface shows relatively dark image contrast at the light contacted area, which is possibly due to the structural modification at the top atomic layer. The high local contacting pressure pushes part of the needle into the surface which causes fracture, resulting in the formation of grooves at the surface. It is possible to have plastic deformation in this process, but no evidence has been found for the presence of cracking. The observations support the adhesion frictional mechanism rather than the micro-cleavage model.
A multiwall carbon nanotube (MWCNT) consists of several or many concentric carbon shells, each of which could be metallic or semiconducting. Both theoretical predictions and experimental results suggest that MWCNTs have exotic electronic structures and intriguing transport properties, which are highly dependent on chirality of each shell. However, the structural defects and the random distribution of chirality of each concentric graphitic shell make the MWCNTs difficult for basic research and technological applications. Thus far, it is still a challenge to get the high crystalline MWCNTs with limited atomic conformation. Here, we report the synthesis of high crystalline MWCNTs made of monochirality graphite shells by a low-temperature chemical vapor deposition (CVD) process in plasma environment. Structural analysis, carried out by transmission electron microscopy (TEM) image and electron diffraction methods, reveal that the MWCNTs are well-crystallized and that most of them have nearly identical chiralities.
In this book the theories, techniques and applications of reflection electron microscopy (REM), reflection high-energy electron diffraction (RHEED) and reflection electron energy-loss spectroscopy (REELS) are comprehensively reviewed for the first time. The book is divided into three parts: diffraction, imaging and spectroscopy. The text is written to combine basic techniques with special applications, theories with experiments, and the basic physics with materials science, so that a full picture of RHEED and REM emerges. An entirely self-contained study, the book contains much invaluable reference material, including FORTRAN source codes for calculating crystal structures data and electron energy loss spectra in different scattering geometries. This and many other features make the book an important and timely addition to the materials science literature.