A dynamical multiple elastic and inelastic electron scattering theory is proposed and is applied to the plural scattering cases of phonon, single-electron and valence (or plasmon) excitations. The incoherence of all the possible inelastic scattering processes of different energies and momenta is evaluated analytically before any numerical calculations. The effects of multiple scattering are equivalent partially to the broadening of the scattering function of a single inelastic process by those of others and partially to the re-scattering of the Kikuchi pattern produced in one inelastic process by others. The final diffraction pattern is a convoluted result of those Kikuchi patterns produced by different inelastic scattering processes. All these characteristics can be considered in just one single formula. The theory of multiple-phonon excitations in simulating high-angle annular-dark-field (ADF) scanning transmission electron-microscopy (STEM) images is proposed. It is shown that the single-phonon scattering model is a good approximation except at the points close to atomic nuclei if the electron probe is comparable in size to that of an atom. The higher-order phonon scattering may improve the resolution of the ADF STEM images of thin crystals.
Fundamentals of Scanning Electron Microscopy (SEM).- Backscattering Detector and EBSD in Nanomaterials Characterization.- X-ray Microanalysis in Nanomaterials.- Low kV Scanning Electron Microscopy.- E-beam Nanolithography Integrated with Scanning Electron Microscope.- Scanning Transmission Electron Microscopy for Nanostructure Characterization.- to In-Situ Nanomanipulation for Nanomaterials Engineering.- Applications of FIB and DualBeam for Nanofabrication.- Nanowires and Carbon Nanotubes.- Photonic Crystals and Devices.- Nanoparticles and Colloidal Self-assembly.- Nano-building Blocks Fabricated through Templates.- One-dimensional Wurtzite Semiconducting Nanostructures.- Bio-inspired Nanomaterials.- Cryo-Temperature Stages in Nanostructural Research.
The modified multislice theory [Wang (1989). Acta Cryst. A45, 193-199] has been employed to calculate the electron reflection intensity with and without considering the plasmon diffuse scattering in the geometry of reflection high-energy electron diffraction (RHEED). It has been shown that the inelastic scattering can greatly enhance the reflectance of a surface, depending critically on the incident conditions of the electrons. At some incidences, the inelastic resonance reflection is enhanced, which is considered as the 'true' surface resonance state. This happens within a very narrow angular range (<1 mrad). For 'true' resonance states, the inelastic intensity is much stronger than for other conditions as shown both theoretically and experimentally. The enhancement of the reflection intensity may not be the proper criterion for identifying the 'true' surface resonance. Besides the surface plasmon peaks, an 'extra' peak, located at 4.5 eV, is observed in the reflection electron energy-loss spectroscopy (REELS) study of the 'true' resonance of GaAs (110) surface. This is considered as a characteristic of the resonance propagations of the electrons along the surface and may result from the generation of resonance radiation.
ADVERTISEMENT RETURN TO ISSUEPREVArticleNEXTAn extended universal coexistence curve for polymer solutionsBenjamin Chu and Zhulun WangCite this: Macromolecules 1988, 21, 7, 2283–2286Publication Date (Print):July 1, 1988Publication History Published online1 May 2002Published inissue 1 July 1988https://pubs.acs.org/doi/10.1021/ma00185a069https://doi.org/10.1021/ma00185a069research-articleACS PublicationsRequest reuse permissionsArticle Views94Altmetric-Citations47LEARN ABOUT THESE METRICSArticle Views are the COUNTER-compliant sum of full text article downloads since November 2008 (both PDF and HTML) across all institutions and individuals. These metrics are regularly updated to reflect usage leading up to the last few days.Citations are the number of other articles citing this article, calculated by Crossref and updated daily. Find more information about Crossref citation counts.The Altmetric Attention Score is a quantitative measure of the attention that a research article has received online. Clicking on the donut icon will load a page at altmetric.com with additional details about the score and the social media presence for the given article. Find more information on the Altmetric Attention Score and how the score is calculated. Share Add toView InAdd Full Text with ReferenceAdd Description ExportRISCitationCitation and abstractCitation and referencesMore Options Share onFacebookTwitterWechatLinked InRedditEmail Other access optionsGet e-Alertsclose Get e-Alerts
In classical electrodynamics, by motion for either the observer or the media, it is always naturally assumed that the relative moving velocity is a constant along a straight line (e.g., in inertia reference frame), so that the electromagnetic behavior of charged particles in vacuum space can be easily described using special relativity. However, for engineering applications, the media have shapes and sizes and may move with acceleration, and recent experimental progresses in triboelectric nanogenerators have revealed evidences for expanding Maxwell’s equations to include media motion that could be time and even space dependent. Therefore, we have developed the expanded Maxwell’s equations for a mechano-driven media system (MEs-f-MDMS) by neglecting relativistic effect. This paper first presents the updated progresses made in the field. Second, we extensively investigated Faraday’s law of electromagnetic induction for a media system that moves with an acceleration. We concluded that the newly developed MEs-f-MDMS are required for describing the electrodynamics inside a media that has a finite size and volume and move with and even without acceleration. The classical Maxwell’s equations are to describe the electrodynamics in vacuum space when the media in the nearby move.